Group Title: sensitivity of two beam transmission electron microscope images to the structure of small crystal defects /
Title: The Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
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Permanent Link: http://ufdc.ufl.edu/UF00099372/00001
 Material Information
Title: The Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
Physical Description: vi, 225 leaves : ill. ; 28 cm.
Language: English
Creator: Sykes, Lawrence Joseph, 1955-
Publication Date: 1981
Copyright Date: 1981
 Subjects
Subject: Transmission electron microscopes   ( lcsh )
Electron microscopy   ( lcsh )
Crystals -- Defects   ( lcsh )
Materials Science and Engineering thesis Ph. D
Dissertations, Academic -- Materials Science and Engineering -- UF
Genre: bibliography   ( marcgt )
non-fiction   ( marcgt )
 Notes
Thesis: Thesis (Ph. D.) --University of Florida, 1981.
Bibliography: Bibliography: leaves 220-224.
General Note: Typescript.
General Note: Vita.
Statement of Responsibility: by Lawrence Joseph Sykes.
 Record Information
Bibliographic ID: UF00099372
Volume ID: VID00001
Source Institution: University of Florida
Holding Location: University of Florida
Rights Management: All rights reserved by the source institution and holding location.
Resource Identifier: alephbibnum - 000297676
oclc - 08482591
notis - ABS4051

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