Title: MAIC newsletter
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Permanent Link: http://ufdc.ufl.edu/UF00091100/00006
 Material Information
Title: MAIC newsletter
Series Title: MAIC newsletter
Physical Description: Serial
Language: English
Creator: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Publisher: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Place of Publication: Gainesville, Fla.
Publication Date: October 2004
 Record Information
Bibliographic ID: UF00091100
Volume ID: VID00006
Source Institution: University of Florida
Holding Location: University of Florida
Rights Management: All rights reserved by the source institution and holding location.

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Newsletter

Major Analytical Instrumentation Center
107 MAEC, PO Box 116400, Gainesville, FL 32611
Phone :(352) 392-6985 Fax :(352) 392-0390


Digital Imaging on the JEOL 200CX TEM
By K. Siebein


October 200




Voue ,Isu

Content



Directors Corne

Digial magig o th



JEOL 20CX TE




Autoprbe 200 An in
siu iroanplao
fo te I


The JSM6400 (2: newl


The camera is cooled with a Peltier
cooler to extend it's the dynamic
range to 14-bits.The digital camera
operates with Gatan's Digital
Micrograph software. Images can
be collected, saved and joined to
form a montage of a very large field
of view.
The set up is very easy to use and a
great addition to the 200CX.
Authorized users of the TEM JEOL
200CX interested in training on the
use of the camera should contact
Kerry Siebein at ksieb@mse.ufl.edu


We are pleased to announce that
digital image capture is now
available on the JEOL 200CX TEM.
The digital images are acquired
using a Gatan Model 692 Multi Scan
camera that was installed in July.
The camera is mounted above the
phosphor screen and is fully
retractable for conventional TEM
use. The camera provides a wide
field of view, about 6 times larger
than film at the same
magnification. The CCD is 1024 x
1024 pixels, 24 microns each. It has
a high resolution YAG scintillator
and a fiber optical coupling that
delivers high sensitivity and
resolution.











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Image of AL nano-particles analyzed in the
TEM 200CX (by Kerry Siebein)


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Smulti-scan camera has been added to te 2


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on the -camer and new is available for
authorized uss of te i. Ao in te lt fw m
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E-mail: maic mse.ufl.edu Web Page: www.maic.mse.ufl.edu


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Image of type-1 collagen prepared by
cryofracture and analyzed in the TEM 200CX
(by Dr. Matt Olszta)








Autoprobe 200: an in-
situ micro-manipulator
for the FIB
By G. Bourne

The FEI DB 235 Focused Ion Beam
microscope has been upgraded with
Omniprobe's Autoprobe 200. The
Autoprobe 200 is an electro-
mechanical probe enabling the
micromanipulation of samples and
the ability to make in-situ TEM lift
outs. Samples manufactured with
this technique have a high success
rate and can be thinned further, if
necessary, after TEM examination.
The Autoprobe's computer control
includes the ability to save and
return to stored positions while
providing an extremely user-
friendly stage reference for probe
translation.
Authorized users of the FIB
interested in training on the use of
the Autoprobe 200 should contact
Jerry Bourne at grb@ufl.edu


The JSM-6400 (2):
newly equipped with
EDS
By A. Dempere

The JSM -6400 (Unit -2) has been
equipped with an EDS Link ISIS
system from Oxford Instruments.
The system enhances the
capabilities of this microscope
allowing for elemental qualitative
and semi-quantitative analysis.
This unit is used mainly for
teaching and training purposes and
a proficient operation of this
system is required as a pre-
requisite for further training on our
Field Emission Scanning Electron
Microscopes, Microprobe
Superprobe 733, and Auger Electron
Spectrometer (AES).
The Link ISIS system allows for
linescans, x-ray mapping, phase
mapping, intensity histograms, and
surface roughness measurements.
In most cases, the SEM course is a
pre-requisite for SEM training at
the MAIC. This course (EMA 6507C)
is offered every year in the Summer
and Fall semesters.


Conferences 2005
By A. Dempere

The 2005 Annual Joint Symposium
of the Florida Chapter of the AVS
Science and Technology Society
(FLAVS), the Florida Sociaty for
Microscopy (FSM) will be hosting
the conference Applied Surface
Science 2005 from March 13-17at
the University of Central Florida in
Orlando.
The deadline for submission of
student posters in January 21,
2005. For more information
regarding the symposium and
poster competition visit the
symposium web site at:
www.flavs.org

The conference Microscopy and
Microanalysis 2005 will be held in
Honolulu, Hawaii from July 31 to
August 4, 2005. The call for papers
is expected in the next few weeks
with a deadline for submission in
mid February 2005. For more
information visit the Microscopy
Society of America (MSA) web site
at www.microscopy.com.


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site: www.omniprobe.com)



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