Title: MAIC newsletter
Full Citation
Permanent Link: http://ufdc.ufl.edu/UF00091100/00005
 Material Information
Title: MAIC newsletter
Series Title: MAIC newsletter
Physical Description: Serial
Language: English
Creator: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Publisher: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Place of Publication: Gainesville, Fla.
Publication Date: March 2004
 Record Information
Bibliographic ID: UF00091100
Volume ID: VID00005
Source Institution: University of Florida
Holding Location: University of Florida
Rights Management: All rights reserved by the source institution and holding location.


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Dual Beam FIB: FEI Strata DB235
By Carrie Ross

The FEI Strata DB 235 system
combines scanning electron microscopy
(SEM) and focused ion beam (FIB)
capabilities in one system; allowing
users to perform advanced three-
dimensional characterization and
analysis. The Strata DB 235 allows for
high-resolution imaging and cross-
sectioning in a precise location. For this
reason, it is being used primarily for
Transmission Electron Microscopy
(TEM) sample preparation. Completed
samples are generally 20pm long, 5pm
deep, and less than 100nm thick,
providing the user with microns of
material to image.

Focused Ion Beam
FEI Strata DB 235


The DualBeam system includes features
such as e-beam or i-beam platinum
deposition and automated site-specific
cross-sectioning without the risk of
destroying the area of interest. The
finely-focused gallium ion beam
removes or deposits material on the sub-
micron scale, with aperture sizes that
can be tuned to fit the proposed
application. The ability to concurrently
mill and image in the same tool allows
for investigation of interfaces,
morphology, and defects below the

FIB Cross Section of Ni-based
Superallov (by Carrie Ross)

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The AIC aciitie hav exande to nclde nnomehancal estig o


Major Analytical Instrumentation Center
107 MAEC, PO Box 116400, Gainesville, FL 32611
Phone:(352) 392-6985 Fax:(352) 392-0390

Nanomechanical Testing
By Gerald Bourne

One of the newest tools for
materials characterization at
MAIC is the Hysitron
Triboindenter. The
Triboindenter is a depth sensing
indentation device capable of
nanometer displacement
resolution and micro-Newton
loads. In-situ imaging of indents
is possible with the a CCD
camera and a piezo scanning
probe feature. Test modes
include nanoindentation,
nanoscratch and nanowear.
Automation of test modes is
achieved through a computer
controlled stage. The
Triboindenter includes options
for high loads and dynamic
mechanical testing. The high
load option allows application of
loads up to 5 Newtons to bridge
the gap between nanoindentation
and conventional microhardness
testers.. The dynamic
mechanical analysis measures
storage and loss modulus and
phase shifts of load response in
viscoelastic materials. Areas of
research include thin films,
surface modifications,
biomaterials, microstructural
mapping, tribology, and more.

Field Emission SEM:
By Brad Willenberg

MAIC has recently acquired an
FEI XL-40 Scanning Electron
Microscope (SEM). The unit is
equipped with a thermal field
emission gun making the scope
ideal for investigation of a wide
range of materials. The
motorized stage and extra large
chamber volume allow users to
analyze samples in bulk form or
to run multi-sample surveys. The
microscope is computer
controlled via a user friendly
software. The XL-40 is currently
configured with a removable
electron backscatter detector and
an Oxford Energy Dispersive X-
ray detector system (EDS). The
accompanying Oxford Link-Isis
software package makes possible
digital image capture and
advanced features such as X-ray
mapping, linescans, phase
mapping, etc.

E-Beam Lithography:
The NPGS System
By Amelia Dempere

The Nanometer Pattern
Generation System NPGS, from
JC Nabity Lithography Systems,
is an easy to use system for doing
state-of-the-art beam or ion beam
lithography using a commercial
Scanning Electron microscope
(SEM). This system has been
incorporated to the new XL-40
FEG-SEM at the MAIC.

Surface profile of wear test on gold with the Hysitron' s
Tribolndenter at the MAIC (by Gerald Bourne)

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