Title: MAIC newsletter
Full Citation
Permanent Link: http://ufdc.ufl.edu/UF00091100/00002
 Material Information
Title: MAIC newsletter
Series Title: MAIC newsletter
Physical Description: Serial
Language: English
Creator: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Publisher: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Place of Publication: Gainesville, Fla.
Publication Date: July 2002
 Record Information
Bibliographic ID: UF00091100
Volume ID: VID00002
Source Institution: University of Florida
Holding Location: University of Florida
Rights Management: All rights reserved by the source institution and holding location.


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V 3,I I
Diecors ore

Fall 200 Course

Special Researc


Nanomechanical Testing

A TriboScope Nanomechanical
Test Instrument from Hysitron, Inc.
has been interfaced with the
MAIC's Digital Scanning Probe
Microscope (SPM) Nanoscope III in
room 113-B at the Engineering
Research Center (ERC).
This unique combination provides in
situ imaging and quantitative depth-
sensing nano-indentation data.
The system allows viewing the
material and accurate positioning a
diamond tip for precise indentation
on desired topographical features.
After testing, images and force vs.
displacement curves can be
obtained. With a load range of 100
nN to 30 mN, the TriboScope is
perfect for testing a wide variety of
Applications include nano-
mechanical testing of thin films for
disks and heads, composite
materials, microelectronic integrated
circuits and passivation layers. The
system allows nanomachining,
nanoindentation, nanoscratching and
wear tests in a repeatable manner.

Triboscope /Nanoscope III

Training and service will be offered
in the Fall 2002.

Te I D. D P. I and D [is D.

BMAIC web page: http://mse.ufl.edul~maic/ E-mail: maic mse.ufl.edu

Major Analytical Instrumentation Center
107 MEL, PO Box 116400, Gainesville, FL 32611
Phone:(352) 392-6985 Fax:(352) 392-0390

Dr. Karin PriiBner
TEM and Associated

Dr. Karin PriiBner has joined the
faculty of the MAIC in the area of
Transmission Electron Microscopy
and associated techniques. She
obtained her Ph.D. in Materials
Science at the Max-Planck-Institut
fir Metallforschung and was
working as a Research Assistant
Professor at the Institute for
Materials Technology at the
University of Siegen in Germany.
Areas of scientific expertise include
correlation processing/micro-
structure/properties, development of
high temperature materials and
protective coatings, environmental
effects on materials, surface
engineering, development of
metal/ceramic composites,
characterization of micro/nano
structures and micro/nano chemistry
of materials, metal/ceramic
interfaces, interfacial reactions,
gas/metal reactions, crystallization
and phase transformations, diffusion
in solids. Dr. PriiBner is willing to
collaborate with faculty members
who intend to submit proposals that
require a significant level of
materials characterization. Also,
please contact Dr. PriiBner for
service and training on TEM and
associated techniques.

E-mal: pru~ms( f:ed

Fall 2002 Courses
Special Research

The topics to be covered by the
Special Research Techniques course
in the Fall 2002 are: Auger Electron
Spectroscopy (Instructor: Eric
Lambers) and Introduction to X-ray
diffraction for thin film analysis
(Instructor: Dr. Valentin Craciun).
Both courses include 1 hour of
theory and 2 hours of training
weekly. Training of XRD course
will be on the Phillips X'Pert MRD
diffractometer. The topics to be
covered include: phase analysis,
diffraction, line profile analysis, and
grazing angle x-ray diffraction,
X-ray reflectivity and simulation
Rocking curves. These courses will
be offered in addition to Scanning
Electron Microscopy (SEM) and X-
ray Microanalysis, and
Transmission Electron Microscopy

Instrument Training
Dimension 3100 SPM &

Training on the Digital Dimension
3100 Scanning Probe Microscope
(SPM) in MAIC room 107A will be
offered in the Fall 2002 to the
authorized users of the Digital SPM
Nanoscope III in room 113-B at the
Engineering Research Center.
Training on the Fourier Transform
Infrared (FTIR) in MAE room 118
will also be available.
Please contact MAIC for more
information and schedule of training

Cororaio to the !,I
MIC Membersh [' ol ip'loo

The following consumables and supplies can be purchased at the MAIC:
Aluminum and Carbon mounts for SEM samples, Polaroid film, Floppy and Zip disks, Carbon and Silver
paint, Silicon Nitride Contact and SiliconTapping mode tips for Scanning Probe Microscopy, sample
mounting grids (Lacey Carbon and SiO) for TEM, Kodak TEM Film.
Any other required supplies and consumables must be purchased from the manufacturer by the users of the
facilities. Links to web pages of manufacturers can be found at the MAIC web page.
Please contact us for more information and prices on supplies and consumables sold at the MAIC.

Acknowledging MAIC
The MAIC would like to thank the following UF faculty and their students
for acknowledging the MAIC in the posters presented at the AVS-FSM
meeting in Orlando:
Dr. Anthony Brennan
Dr. Stephen Pearton
Dr. Fan Ren
Dr. Cammy Abernathy
Dr. Brent Gila.
It is important to us that our users acknowledge the use of our facilities
and the assistance of our staff members recognizing MAIC's contribution
to research activities not only in the department of Materials Science and
Engineering but also through our work with other departments at the
University of Florida, the Florida's State University System (SUS) and
other Universities across the U.S. and overseas.
Thank you very much for acknowledging and recognizing our work!

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