Title: MAIC newsletter
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Title: MAIC newsletter
Physical Description: Serial
Language: English
Creator: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Publisher: Major Analytical Instrumentation Center, College of Engineering, University of Florida
Place of Publication: Gainesville, Fla.
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Bibliographic ID: UF00091100
Volume ID: VID00001
Source Institution: University of Florida
Holding Location: University of Florida
Rights Management: All rights reserved by the source institution and holding location.

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Florida AVS-FSM 2002
Symposium
The 2002 Annual Joint Meeting of
the Florida Chapter of the American
Vacuum Society (AVS) and the
Florida Society for Microscopy
(FSM) was held in Orlando from
March 10 March 14th. Dr. Eugene
Goldberg from UF's Materials
Science and Engineering opened the
symposium as the keynote speaker
followed by invited presentations.
Drs. Steven Pearton, David Norton,
Laurie Gower and Susan Sinnott,
from Materials Science and
Engineering, Tim Anderson from
Chemical Engineering, Arthur
Hebbard, from Physics and Mark
Davidson, from Microfabritech -
UF, also presented invited talks.
The student poster competition
started Sunday with the first round
for the judges, and the awardees
were announced on Tuesday
afternoon. There were 21 posters
from UF students, some which
received awards. Several AVS and
vendor sponsored short courses
were offered from Monday, March
11th through Thursday, March 14th.


High Temperature
XRD APD 3720
The High-Temperature XRD system
Philips APD 3720 has been
refurbished and is currently
operative. This system is equipped
with a heating stage which allows
precision temperature stability in a
controlled atmosphere for the
temperature range 25 -1000C.
A computerized search and match
program is available for compound
identification. Software is also
available for quantitative analysis,
line profile analysis, and
crystallographic information.
Applications include compound
identification, temperature
dependence of lattice parameters,
phase transitions, and kinetics of
transformations


Dieto' Cornerh L.. Dem. S S S *









MAIC web page: http://mse.ufl.edu/-maic/ E-mail: maice amse.ufl.edu


Newsletter
Major Analytical Instrumentation Center
107 MEL, PO Box 116400, Gainesville, FL 32611
Phone:(352) 392-6985 Fax:(352) 392-0390








Ultracryomicrotome
Training

The Electron Microscopy Core
Facility at the J. Hillis Miller Health
Science Center offers individual
training in sectioning using the same
microtome that we have in MAIC,
the Leica Ultracut UCT.
The training is provided by a very
experienced microtomist, in the use
of glass knives, making glass
knives, trim and face blocks, cutting
1 micron-thick sections, and
thin/ultra-thin sectioning at ambient
temperature. The training includes
up to 10 hours of instruction and
supervised practice time. The cost
for the training is the same as it will
be when starts to be provided by
MAIC.
Training on thin/ultra-thin
sectioning is provided only once the
student is proficient at 1 micron
sectioning. For training on a
diamond knife the students need to
provide the knife. Training on cryo-
sectioning is a separate training and
can be provided to students that
have become authorized users of the
microtome and have spent
additional time practicing ultra thin
sectioning on the instrument at the
MAIC. Those interested in training
should contact Dr. Jill Verlander,
Director of the Electron Microscope
Core Facility, preferably by e-mail
at verlajimedicine.ufl.edu, to set
up the training sessions.
After the student has completed
their training, they will become an
authorized user of the instrument
and will have access to the
microtome in MAIC to practice or
work on the sectioning of their
research samples.


Fall 2002 Courses
Several MSE courses will be offered
on MAIC instrumentation and
techniques: Transmission Electron
Microscopy (TEM) (Dr. Michael
Kaufman), Scanning Electron
Microscopy (SEM) (Dr. Luisa A.
Dempere), and Special Research
Techniques (Eric Lambers).
The SEM class includes hands-on
experience on operation of the SEM
JEOL JSM-35CF. This class, or
previous experience/training using
an SEM, is a pre-requisite for
training on the SEM JEOL JSM-
6400. The laboratory for TEM
includes training on the operation of
the TEM JEOL 200CX.
The topic to be covered by the
Special Research Techniques course
will be announced in the summer.


New Facilities


A LECO Carbon Determinator and a
Perkin-Elmer 3300 Atomic
Absorption Spectrophotometer have
been donated to the MAIC by
BREED Technologies, Inc.,
Lakeland, Florida. These systems
will be setup in the coming fall
semester to provide service and
training.
The LECO Carbon Determinator
allows the determination of the total
carbon content of a sample by
measuring the thermal conductivity
of the gaseous products of pyrolysis
of the sample. This LECO carbon
analyzer separates the liberated CO2
from the other combustion products
then measures it using a gas
chromatograph equipped with a
thermal conductivity detector.


I LECO WR-112 system


The Perkin-Elmer Atomic
Absorption Spectrophotometer
(AAS) model 3300 is a double-beam
system controlled by a PC.
AAS uses the absorption of light to
measure the concentration of gas-
phase atoms. The sample (liquid or
solid) is vaporized in a flame or a
graphite furnace. The atoms absorb
ultraviolet or visible light and make
transitions to higher electronic
energy levels. Concentrations are
determined from the amount of
absorption. Among the AAS
applications are identification of
metals in organic samples,
geochemical and mineralogical
samples.


Perkin-Elmer AAS Series 300


X-Ray Badges must1 be use at all g] times~ whl opertin the X D faiite at the~ A ICand are requi-lred~



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